Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/6328
Título: | Optimised filters for texture defect detection |
Autor(es): | Sobral, João Luís Ferreira |
Palavras-chave: | Wavelet Defect detection Leather inspection |
Data: | 2005 |
Editora: | IEEE |
Revista: | IEEE International Conference on Image Processing (ICIP) |
Citação: | IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING, Genova, Italy, 2005 – “ICIP-05 : proceedings of the IEEE International Conference on Image Processing.” [S.l.] : IEEE Computer Society Press, 2005. ISBN 0-7803-9134-9. |
Resumo(s): | This paper presents a new approach to texture defect detection based on a set of optimised filters. Each filter is applied to one wavelet sub-band and its size and shape are tuned for a defect type. The wavelet transform provides a very efficient way to decompose a complex texture into a set of base components (wavelet sub-bands), which are then analysed by each filter to detect a kind of defect. The proposed methodology has been successfully applied to leather inspection, achieving the detection rate of highly trained human operators. The process is also fast enough to be used for in-line inspection. |
Tipo: | Artigo em ata de conferência |
URI: | https://hdl.handle.net/1822/6328 |
ISBN: | 0-7803-9134-9 |
DOI: | 10.1109/ICIP.2005.1530454 |
ISSN: | 1522-4880 |
Arbitragem científica: | yes |
Acesso: | Acesso aberto |
Aparece nas coleções: | DI/CCTC - Artigos (papers) |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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ICIP05Publicado_jls.pdf | Documento principal | 575,51 kB | Adobe PDF | Ver/Abrir |