Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/6328

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dc.contributor.authorSobral, João Luís Ferreira-
dc.date.accessioned2007-04-20T23:11:11Z-
dc.date.available2007-04-20T23:11:11Z-
dc.date.issued2005-
dc.identifier.citationIEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING, Genova, Italy, 2005 – “ICIP-05 : proceedings of the IEEE International Conference on Image Processing.” [S.l.] : IEEE Computer Society Press, 2005. ISBN 0-7803-9134-9.eng
dc.identifier.isbn0-7803-9134-9-
dc.identifier.issn1522-4880por
dc.identifier.urihttps://hdl.handle.net/1822/6328-
dc.description.abstractThis paper presents a new approach to texture defect detection based on a set of optimised filters. Each filter is applied to one wavelet sub-band and its size and shape are tuned for a defect type. The wavelet transform provides a very efficient way to decompose a complex texture into a set of base components (wavelet sub-bands), which are then analysed by each filter to detect a kind of defect. The proposed methodology has been successfully applied to leather inspection, achieving the detection rate of highly trained human operators. The process is also fast enough to be used for in-line inspection.eng
dc.description.sponsorshipAgência de Inovação (ADI) - sistema de Geo--referenciação Móvel assistido por Imagem (SiGMA)por
dc.language.isoengeng
dc.publisherIEEEeng
dc.rightsopenAccesseng
dc.subjectWaveleteng
dc.subjectDefect detectioneng
dc.subjectLeather inspectioneng
dc.titleOptimised filters for texture defect detectioneng
dc.typeconferencePapereng
dc.peerreviewedyeseng
oaire.citationStartPage3165por
oaire.citationEndPage3168por
oaire.citationVolume3por
dc.identifier.doi10.1109/ICIP.2005.1530454por
dc.subject.wosScience & Technologypor
sdum.journalIEEE International Conference on Image Processing (ICIP)por
sdum.conferencePublication2005 International Conference on Image Processing (ICIP), Vols 1-5por
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