Corrigendum to “Compositional analysis by RBS, XPS and EDX of ZnO:Al,Bi  and ZnO:Ga,Bi thin films deposited by d.c. magnetron sputtering” [Vacuum  161 (2019) 268–275]

Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/73028

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Campo DC	Valor	Idioma
dc.contributor.author	Ribeiro, J. M.	por
dc.contributor.author	Correia, Filipe Costa	por
dc.contributor.author	Salvador, Paulo Miguel Babo Cunha	por
dc.contributor.author	Rebouta, L.	por
dc.contributor.author	Alves, L. C.	por
dc.contributor.author	Alves, E.	por
dc.contributor.author	Barradas, N. P.	por
dc.contributor.author	Mendes, A.	por
dc.contributor.author	Tavares, C. J.	por
dc.date.accessioned	2021-05-28T14:23:30Z	-
dc.date.issued	2020-10	-
dc.identifier.issn	0042-207X	-
dc.identifier.uri	https://hdl.handle.net/1822/73028	-
dc.description.abstract	The authors regret for the typographical error in the value of the Zn 2p binding energy in some parts of the document. The authors would like to apologise for any inconvenience caused.	por
dc.language.iso	eng	por
dc.publisher	Elsevier 1	por
dc.rights	restrictedAccess	por
dc.title	Corrigendum to “Compositional analysis by RBS, XPS and EDX of ZnO:Al,Bi and ZnO:Ga,Bi thin films deposited by d.c. magnetron sputtering” [Vacuum 161 (2019) 268–275]	por
dc.type	corrigendum	por
dc.peerreviewed	yes	por
dc.relation.publisherversion	https://www.sciencedirect.com/science/article/pii/S0042207X20304711	por
oaire.citationVolume	180	por
dc.date.updated	2021-05-26T17:49:07Z	-
dc.identifier.doi	10.1016/j.vacuum.2020.109608	por
dc.date.embargo	10000-01-01	-
dc.subject.wos	Science & Technology	-
sdum.export.identifier	10888	-
sdum.journal	Vacuum	por
Aparece nas coleções:	CDF - GRF - Outros Documentos/Other Documents (without refereeing)