Corrigendum to “Compositional analysis by RBS, XPS and EDX of ZnO:Al,Bi  and ZnO:Ga,Bi thin films deposited by d.c. magnetron sputtering” [Vacuum  161 (2019) 268–275]

Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/73028

Título:	Corrigendum to “Compositional analysis by RBS, XPS and EDX of ZnO:Al,Bi and ZnO:Ga,Bi thin films deposited by d.c. magnetron sputtering” [Vacuum 161 (2019) 268–275]
Autor(es):	Ribeiro, J. M. Correia, Filipe Costa Salvador, Paulo Miguel Babo Cunha Rebouta, L. Alves, L. C. Alves, E. Barradas, N. P. Mendes, A. Tavares, C. J.
Data:	Out-2020
Editora:	Elsevier 1
Revista:	Vacuum
Resumo(s):	The authors regret for the typographical error in the value of the Zn 2p binding energy in some parts of the document. The authors would like to apologise for any inconvenience caused.
Tipo:	Corrigenda
URI:	https://hdl.handle.net/1822/73028
DOI:	10.1016/j.vacuum.2020.109608
ISSN:	0042-207X
Versão da editora:	https://www.sciencedirect.com/science/article/pii/S0042207X20304711
Arbitragem científica:	yes
Acesso:	Acesso restrito UMinho
Aparece nas coleções:	CDF - GRF - Outros Documentos/Other Documents (without refereeing)