Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/61340| Título: | Strain dependence electrical resistance and cohesive strength of ITO thin films deposited on electroactive polymer |
| Autor(es): | Rebouta, L. Rubio-Peña, L. Oliveira, C. Lanceros-Méndez, S. Tavares, C. J. Alves, E. |
| Palavras-chave: | Tensile test ITO Cohesive strength Crack onset strain Electroactive polymers |
| Data: | 1-Jun-2010 |
| Editora: | Elsevier Science SA |
| Revista: | Thin Solid Films |
| Resumo(s): | Transparent, conducting, indium tin oxide (ITO) films have been deposited, by pulsed dc magnetron sputtering, on glass and electroactive polymer (poly(vinylidene fluoride)-PVDF) substrates. Samples have been prepared at room temperature by varying the oxygen partial pressure. Electrical resistivity around 8.4 x 10(-4) Omega cm has been obtained for films deposited on glass, while a resistivity of 1.7 x 10(-3) Omega cm has been attained in similar coatings on PVDF. Fragmentation tests were performed on PVDF substrates with thicknesses of 28 mu m and 110 mu m coated with 40 nm ITO layer. The coating's fragmentation process was analyzed and the crack onset strain and cohesive strength of ITO layers were evaluated. |
| Tipo: | Artigo |
| URI: | https://hdl.handle.net/1822/61340 |
| DOI: | 10.1016/j.tsf.2009.12.022 |
| ISSN: | 0040-6090 |
| Arbitragem científica: | yes |
| Acesso: | Acesso aberto |
| Aparece nas coleções: | CDF - GRF - Artigos/Papers (with refereeing) |
Ficheiros deste registo:
| Ficheiro | Descrição | Tamanho | Formato | |
|---|---|---|---|---|
| TSF_518_2010_4525–4528_Strain dependence electrical resistance and cohesive strength of ITO thin films deposited on electroactive polymer.pdf | 768,19 kB | Adobe PDF | Ver/Abrir |
