Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/36908

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Campo DCValorIdioma
dc.contributor.authorGarcia, Paulopor
dc.contributor.authorGomes, Tiago Manuel Ribeiropor
dc.contributor.authorSalgado, Filipepor
dc.contributor.authorCardoso, Paulopor
dc.contributor.authorCabral, Jorgepor
dc.contributor.authorEkpanyapong, M.por
dc.date.accessioned2015-09-08T13:40:09Z-
dc.date.available2015-09-08T13:40:09Z-
dc.date.issued2012-
dc.identifier.isbn978-1-4673-4737-2-
dc.identifier.issn1946-0740por
dc.identifier.urihttps://hdl.handle.net/1822/36908-
dc.description.abstractThe proliferation of highly-configurable FPGA technology has allowed the implementation of dedicated systems of diverse configurations and fueled the software to hardware migration paradigm. This work demonstrates how the hardware implementation of virtualization technology affects the system reliability at several levels of abstraction. By correlating faults between the physical and virtual, the reliability impact of hardware-assisted virtualization is shown, as well as how runtime faults are capable of breaching virtualization. ISA profiling is used to assess reliability at early design stages and how its use can serve as a robustness guideline for hardware and software designers is explained.por
dc.language.isoengpor
dc.publisherIEEEpor
dc.rightsrestrictedAccesspor
dc.titleReliability correlation between physical and virtual cores at the ISA levelpor
dc.typeconferencePaperpor
dc.peerreviewedyespor
sdum.publicationstatuspublishedpor
oaire.citationStartPage1por
oaire.citationEndPage4por
oaire.citationConferencePlaceKrakow, Polandpor
oaire.citationTitleEmerging Technologies & Factory Automation (ETFA), 2012 IEEE 17th Conference onpor
dc.identifier.doi10.1109/ETFA.2012.6489725por
dc.subject.wosScience & Technologypor
sdum.journalIEEE International Conference on Emerging Technologies and Factory Automation - ETFApor
sdum.conferencePublicationEmerging Technologies & Factory Automation (ETFA), 2012 IEEE 17th Conference onpor
Aparece nas coleções:CAlg - Artigos em livros de atas/Papers in proceedings

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