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https://hdl.handle.net/1822/35072
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Campo DC | Valor | Idioma |
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dc.contributor.author | Costa, Manuel F. M. | por |
dc.contributor.author | Pereira, Pedro B. | por |
dc.date.accessioned | 2015-05-06T15:36:42Z | - |
dc.date.available | 2015-05-06T15:36:42Z | - |
dc.date.issued | 2013 | - |
dc.identifier.citation | International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013),edited by Chenggen Quan, Kemao Qian, Anand Asundi, Proc. of SPIE Vol. 8769, 87690O© 2013 SPIE · CCC code: 0277-786X/13/$18 · doi: 10.1117/12.2016662 | por |
dc.identifier.isbn | 9780819495679 | por |
dc.identifier.issn | 0277-786X | por |
dc.identifier.uri | https://hdl.handle.net/1822/35072 | - |
dc.description.abstract | The roughness of teeth’ enamel is an important parameter in orthodontics. One example is the application in the process of decreasing tooth-size by reducing the interproximal enamel surfaces (stripping) of teeth. In order to achieve smooth surfaces clinicians have been testing various methods and progressively improved this therapeutic technique. The evaluation the surface roughness following teeth interproximal reduction is fundamental in the process. In general tooth’ surface is not flat presenting a variety of complex geometries. In this communication we will report on the metrological procedure employed on the rugometric and microtopographic inspection by optical active triangulation of raw and processed (interproximal stripping) tooth surfaces. | por |
dc.description.sponsorship | This work was supported by FEDER through the COMPTETE Program and by the Portuguese Foundation for Science and Technology (FCT) in the framework of the Strategic Project PEST-C/FIS/UI607/2011. | por |
dc.language.iso | eng | por |
dc.publisher | Society of Photo-optical Instrumentation Engineers (SPIE) | por |
dc.rights | restrictedAccess | por |
dc.subject | Microtopography | por |
dc.subject | Roughness | por |
dc.subject | Interproximal stripping reduction | por |
dc.subject | Orthodontics | por |
dc.title | Rugometric and microtopographic inspection of theet' enamel | por |
dc.type | conferencePaper | por |
dc.peerreviewed | yes | por |
dc.relation.publisherversion | http://spiedigitallibrary.org/ | por |
sdum.publicationstatus | published | por |
oaire.citationStartPage | 87690O-1 | por |
oaire.citationEndPage | 87690O-7 | por |
oaire.citationIssue | 87690O-1 | por |
oaire.citationTitle | Proceedings of SPIE | por |
oaire.citationVolume | 8969 | por |
dc.identifier.doi | 10.1117/12.2016662 | por |
dc.subject.wos | Science & Technology | por |
sdum.journal | Proceedings of SPIE | por |
sdum.conferencePublication | INTERNATIONAL CONFERENCE ON OPTICS IN PRECISION ENGINEERING AND NANOTECHNOLOGY (ICOPEN2013) | por |
Aparece nas coleções: | CDF - OCV - Artigos/Papers (with refereeing) |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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87690O_ICOPEN2013.pdf Acesso restrito! | full paper | 1,6 MB | Adobe PDF | Ver/Abrir |