Utilize este identificador para referenciar este registo: https://hdl.handle.net/1822/15684

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dc.contributor.authorChappé, J. M.-
dc.contributor.authorMarco de Lucas, M. C.-
dc.contributor.authorCunha, L.-
dc.contributor.authorMoura, C.-
dc.contributor.authorPierson, J. F.-
dc.contributor.authorImhoff, L.-
dc.contributor.authorHeintz, O.-
dc.contributor.authorPotin, V.-
dc.contributor.authorBourgeois, S.-
dc.contributor.authorVaz, F.-
dc.date.accessioned2011-12-22T16:16:10Z-
dc.date.available2011-12-22T16:16:10Z-
dc.date.issued2011-10-31-
dc.date.submitted2010-12-20-
dc.identifier.issn0040-6090por
dc.identifier.urihttps://hdl.handle.net/1822/15684-
dc.description.abstractThe evolution of the nanoscale structure and the chemical bonds formed in Ti–C–N–O films grown by reactive sputtering were studied as a function of the composition of the reactive atmosphere by increasing the partial pressure of an O2+N2 gas mixture from 0 up to 0.4 Pa, while that of acetylene (carbon source) was constant. The amorphisation of the films observed by transmission electron microscopy was confirmed by micro- Raman spectroscopy, but it was not the only effect associated to the increase of the O2+N2 partial pressure. The chemical environment of titanium and carbon, analysed by X-ray photoemission spectroscopy, also changes due to the higher affinity of Ti towards oxygen and nitrogen than to carbon. This gives rise to the appearance of amorphous carbon coexisting with poorly crystallized titanium oxynitride. The evolution of the films colour is explained on the basis of these structural changes.por
dc.description.sponsorshipFundação para a Ciência e a Tecnologia (FCT) - PTDC/CTM/69362/2006, SFRH/BPD/27114/2006por
dc.description.sponsorshipCRUP (Acção Integrada Luso-francesa N° F-2307) and the GRICES/CNRS collaboration (Proc. 4.1.1 França)por
dc.language.isoengpor
dc.publisherElsevier 1por
dc.rightsopenAccesspor
dc.subjectTitanium oxy-carbo-nitridespor
dc.subjectReactive sputteringpor
dc.subjectTransmission electron Microscopypor
dc.subjectRaman spectroscopypor
dc.subjectX-ray photoelectron Spectroscopypor
dc.titleStructure and chemical bonds in reactively sputtered black Ti–C–N–O thin filmspor
dc.typearticlepor
dc.peerreviewedyespor
dc.relation.publisherversionhttp://www.sciencedirect.com/por
sdum.publicationstatuspublishedpor
oaire.citationStartPage144por
oaire.citationEndPage151por
oaire.citationIssue1por
oaire.citationTitleThin Solid FIlmspor
oaire.citationVolume520por
dc.identifier.doi10.1016/j.tsf.2011.06.108por
dc.subject.wosScience & Technologypor
sdum.journalThin Solid FIlmspor
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