Utilize este identificador para referenciar este registo:
https://hdl.handle.net/1822/14173
Título: | Photoluminescence of erbium doped microcrystalline silicon thin films produced by reactive magnetron sputtering |
Autor(es): | Cerqueira, M. F. Stepikhova, M. Ferreira, J. A. |
Palavras-chave: | Photoluminescence Erbium Nanocrystalline silicon |
Data: | 2001 |
Editora: | Elsevier 1 |
Revista: | Materials Science & Engineering: B |
Resumo(s): | Microcrystalline silicon thin films doped with erbium were produced by RF sputtering and their structural, chemical and optical properties were studied by X-ray diffractometry at grazing incidence, Rutherford back scattering and optical transmission spectroscopy. The samples exhibit a sharp photoluminescence (PL) spectrum from the Er centres with the strongest peak positioned at 1.536 microm with a full width at half maximum of about 8 nm. When the temperature varies between 5K and 300K the photoluminescence decreases only five fold, in contrast to the behaviour reported for monocrystalline silicon. |
Tipo: | Artigo |
URI: | https://hdl.handle.net/1822/14173 |
DOI: | 10.1016/S0921-5107(00)00684-X |
ISSN: | 0921-5107 |
Versão da editora: | http://www.sciencedirect.com/science/article/pii/S092151070000684X |
Arbitragem científica: | yes |
Acesso: | Acesso aberto |
Aparece nas coleções: | CDF - FMNC - Artigos/Papers (with refereeing) |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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PL-SiEr-MSE2001.pdf | Documento principal | 228,11 kB | Adobe PDF | Ver/Abrir |